DB-FIB
Intangiriro ya serivisi
Kugeza ubu, DB-FIB (Dual Beam Focused Ion Beam) ikoreshwa cyane mubushakashatsi no kugenzura ibicuruzwa mubice nka:
Ibikoresho by'ubutaka ，Polymers ，Ibikoresho by'ibyuma ，Ubushakashatsi ku binyabuzima ，Amashanyarazi ，Ubumenyi bwa geologiya
Urwego rwa serivisi
Ibikoresho bya Semiconductor, ibikoresho bito bya molekile ntoya, ibikoresho bya polymer, ibikoresho bya organic / organic organique, ibikoresho bya organic organique bitari metallic
Amavu n'amavuko ya serivisi
Hamwe niterambere ryihuse rya elegitoroniki ya semiconductor hamwe na tekinoroji yumuzunguruko, ubwiyongere bwibikoresho nibikoresho byizunguruka byazamuye ibisabwa kugirango hasuzumwe mikorobe ya elegitoroniki, gusuzuma kunanirwa, no guhimba micro / nano.Sisitemu ya Dual Beam FIB-SEM, hamwe nubushobozi bukomeye bwo gutunganya no gusesengura microscopique, byabaye ingirakamaro mugushushanya no gukora mikorobe.
Sisitemu ya Dual Beam FIB-SEMihuza byombi Ion Beam (FIB) hamwe na Scanning Electron Microscope (SEM). Ifasha igihe nyacyo SEM kwitegereza imikorere ya micromachining ya FIB, ihuza imiterere ihanitse yumurongo wa electron hamwe nubushobozi bwo gutunganya ibikoresho bya ion beam.
Ibintu bya serivisi
Urubuga-Itegurwa ryihariye-Igice cyo Gutegura
TEM Icyitegererezo Cyerekana Isesengura
Sgutoranya gutoranya cyangwa kugenzura neza
Metal hamwe no Gukingira Ibizamini byo Kubika
Bifitanye isanoIBICURUZWA
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Terefone
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E-imeri
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Hejuru